| Title |
Possibilities for unification of hardware and software testing / |
| Authors |
Šeinauskas, Rimantas ; Šeinauskas, Vytenis |
| Full Text |
|
| Is Part of |
Baltic journal of modern computing.. Riga : University of Latvia. 2014, vol. 2, iss. 4, p. 227-247.. ISSN 2255-8942 |
| Keywords [eng] |
embedded systems testing ; hardware and software testing ; overall testing criteria |
| Abstract [eng] |
The object is an integrated testing of embedded systems, in which some functions are implemented as software and other functions like hardware. Hardware and software test generation is moving into the initial design stages and is carried out at a higher level of abstraction. This creates the conditions for the use of uniform models and criteria for test generation and exploits the achievements of different domains. A formulated unified task of testing allows the use of test sequences. Binary finite-state machine model is a uniform format for test generation. High abstraction level criteria for hardware and software testing are compared and the possibility of use of the two criteria is discussed. Disclosure outside of state variables simplifies test generation and increases test quality. The proposed unified test generation and testing process allows the flexibility to exploit the opportunities of development environment, test oracle and criterion calculation. Experiments with software testing benchmarks confirmed that the criterion at a high level of abstraction that is used to test hardware can be successfully used in software testing. Integrated testing of embedded systems has to use together criteria, which are intended for hardware and software testing. |
| Published |
Riga : University of Latvia |
| Type |
Journal article |
| Language |
English |
| Publication date |
2014 |
| CC license |
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