Title The mathematical model of conductance measurement in growing thin films /
Another Title Augančio kondensato laidžio matavimo matematinis modelis.
Another Title Математическая модель метода измерения проводимости тонких плёнок во время их роста.
Authors Sinkevičius, V
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Is Part of Elektronika ir elektrotechnika.. Kaunas : Technologija. 2008, Nr. 5, p. 17-20.. ISSN 1392-1215. eISSN 2029-5731
Abstract [eng] The island stage, mono–atomic layers or self–organized derivatives are derivable producing nanostructures by vacuum technology. These layers are too thin for traditional measurements of their resistance or thickness. The non–invasive measurement was proposed for the measurement of these stages. The mathematical model of the non–invasive measurement of the condensate resistance, taking into account the potential distribution in the surface of the measurement probe, was created.
Published Kaunas : Technologija
Type Journal article
Language English
Publication date 2008
CC license CC license description