| Title |
Tips for shear force microscopy fabricated by controlled etching / |
| Another Title |
Kontroliuojamu ėsdinimu pagaminti zondai skersinės jėgos mikroskopijai. |
| Authors |
Limanauskas, L |
| Full Text |
|
| Is Part of |
Mechanika.. Kaunas : Technologija. 2009, Nr. 1, p. 56-61.. ISSN 1392-1207. eISSN 2029-6983 |
| Abstract [eng] |
The article presents specific aspects of a technology designed to produce sensors for shear force microscopy (SFM). The sensor consists of a quartz plug with an agglutinated probe made from tungsten wire, the tip of which has been sharpened by electrochemical etching up to 50 nm and less. The presentation includes a theoretical mathematical background for electrochemical etching of the wire, which served as a basis for the selection of voltage/ current regimes and other technological parameters that allow obtaining appropriate sharpness of the probe. The use of the sensors in experimental measurements carried out for the evaluation of their reliability attest to the efficiency of the developed technology. The positive results of our experimental research are valuable in the production of SFM sensors; on the other hand, they contribute to the expansion of experimental potential in such areas of research as nanotribology, nanolithography, nanometric acoustic spectroscopy and analysis of biological objects in liquids. |
| Published |
Kaunas : Technologija |
| Type |
Journal article |
| Language |
English |
| Publication date |
2009 |
| CC license |
|
