Title Formation and characterization of mixed copper sulfide – copper telluride layers on the polyamide 6 film surface
Another Title Mišriųjų vario sulfido ir vario telūrido sluoksnių poliamido 6 plėvelių paviršiuje sudarymas ir apibūdinimas.
Authors Šukytė, Vida Judita ; Janickis, Vitalijus ; Ivanauskas, Remigijus ; Žalenkienė, Skirma
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Is Part of Materials science = Medžiagotyra.. Kaunas : Technologija. 2007, vol. 13, no. 1, p. 33-38.. ISSN 1392-1320. eISSN 2029-7289
Keywords [eng] Polycaproamide ; Potassium pentathionate ; Sulfuration ; Diffusion
Abstract [eng] By a study of IR and UV absorption spectra it is shown that the telluropentathionate anions are sorbed-diffused into the polyamide 6 films if they are treated with the water solutions (0.01 mol.dm–3 − 0.1 mol.dm–3, 20 °C) of sodium telluropentathionate, Na2TeS4O6, or telluropentathionic acid, H2TeS4O6. The concentration of sorbed telluropentathionate ions increases with the increase in duration of treatment and temperature of a TeS4O6 2– containing solution. The mixed copper sulfide – copper telluride, CuxS – CuyTe, layers are formed in the surface of polyamide 6 film if the chalcogenized polymer is treated with Cu(II/I) salt solution (10 min, 78 °C): the anionic particles TeS4O6 2– containing tellurium and sulfur atoms of low oxidation state react with the copper(II/I) ions. The conditions of a polymer initial chalcogenation determine the amount of copper and the composition of chalcogenide layer: the amount of copper in the chalcogenide layer increases with the increase of initial chalcogenation duration and the concentration of solution. The results of UV-VIS absorption spectra and X-ray structural analysis confirmed the formation of mixed copper sulfide – copper telluride layers in the surface of polyamide 6. The phase composition of layer changes depending on the conditions of the polymer initial treatment in a TeS4O6 2– solution. Three copper sulfide phases, Cu7S4, Cu1.9375S, Cu1.8S, and four copper telluride phases, Cu2Te, Cu3Te2, CuTe, Cu2.72Te2, were identified in the composition of the layers by X-ray diffraction. [...].
Published Kaunas : Technologija
Type Journal article
Language English
Publication date 2007
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