Title Development and investigation of near-field radiated susceptibility mapping methodology for radio frequency devices /
Translation of Title Elektroninės aukštadažnės įrangos atsparumo spinduliuojamiems elektromagnetiniams trikdžiams tyrimas artimame lauke (metodikos sukūrimas ir taikymas).
Authors Merfeldas, Audrius
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Pages 52
Keywords [eng] emc ; electromagnetic compatibility ; radiated susceptibility ; radiated immunity ; near field probe
Abstract [eng] Radiated susceptibility is mandatory test for both successful electromagnetic compatibility (EMC) tests and product certification procedures. It also reflects the quality of the electronics design and technical solutions to ensure product shows no degradation of performance by presence of any electromagnetic (EM) signals, noises and interferences. This is very important for medical, automotive, aviation and military applications where electronic devices might suffer from high level EM interferences and device operation is related to critical safety. Though high precision and repeatability far-field testing methods often preferred by the full-compliance laboratories, they are lacking of information and often limited to “Pass/Fail” type of results. The proposed improved spatial resolution magnetic near-field probe, the adaptive scanning height methodology and the instruments enables radiated susceptibility mapping and hotspot localization of radio frequency printed circuit boards (PCBs). The detailed analysis of the common electronics components, the PCB layout and the scanning height influence for the -6dB magnetic field aperture size and shape was determined. The developed methodology allows RF susceptibility mapping and hotspot localization for high integration RF devices that might contribute as a helpful tool for troubleshooting and analysis for EMC laboratories.
Dissertation Institution Kauno technologijos universitetas.
Type Summaries of doctoral thesis
Language English
Publication date 2021