| Abstract [eng] |
Surfaces coated with electrically conductive or semi- conductive copper sulphide CuxS layer takes on surfaces of copper sulphides and the characteristics of the combination. Of copper chalcogenide layers deposited on various dielectrics used as semiconductors, photoconductor, light, heat and gas detectors. The aim is on the glass form copper sulfide layers and to describe the layers obtained morphology , elemental and phase composition using SEM, EDS, X- ray analysis methods. Copper sulfide layer on the surface formed as individual crystallites or aggregates. Longer term exposure to elevated temperatures of copper ( II / I) salt solution followed larger aggregates of crystallites , which are evenly borne sulfur layer. EDS showed that the longer treatment with a copper (II / I ) salt solution and increasing the temperature of the solution , the copper content of the layer increases, but the layers remain many unreacted sulfur. X-ray diffraction analysis found several copper sulfide phases: Cu31S16, Cu9S5, Cu7S4 , Cu39S28 and Cu34S32 . The longer the duration of treatment, increasing the temperature of the solution and the reducing agent concentration produces more copper sulfides. |
