| Title |
Analysis of rietveld method application for gyrolite crystal structure refinement |
| Another Title |
Rietveldo metodo taikymo girolito kristalų struktūros parametrams patikslinti analizė. |
| Authors |
Baltušnikas, Arūnas ; Lukošiūtė, Irena ; Levinskas, Rimantas ; Grybėnas, Albertas ; Baltakys, Kęstutis ; Eisinas, Anatolijus |
| DOI |
10.5755/j01.ms.18.4.3101 |
| Full Text |
|
| Is Part of |
Materials science = Medžiagotyra.. Kaunas : KTU. 2012, vol. 18, no. 4, p. 379-384.. ISSN 1392-1320. eISSN 2029-7289 |
| Keywords [eng] |
layered silicate ; gyrolite ; crystal structure ; XRD ; rietveld refinement ; bond restraints |
| Abstract [eng] |
The several simulated X-ray diffraction patterns for calcium silicate hydrate – gyrolite were calculated with GSAS program using the structural model of natural mineral gyrolite and profile parameters values determined from refining crystal structure of real synthetic gyrolite. To determine the limits of the Rietveld method applicability for synthetic gyrolite crystal structure refinement, each simulated pattern was refined by using a biased starting structural model of gyrolite. The complete and precise refinement of all parameters of gyrolite crystal structure was achieved only using structural restraints on bond lengths in tetrahedral, octahedral and interlayer sheets of silicate. |
| Published |
Kaunas : KTU |
| Type |
Journal article |
| Language |
English |
| Publication date |
2012 |
| CC license |
|
