| Title |
Generating functional delay fault test for non-scan sequential circuits |
| Translation of Title |
Funkcinių vėlinimo gedimus tikrinančių testų sudarymas nuoseklioms schemoms, neturinčioms skleidimo registro. |
| Authors |
Bareiša, Eduardas ; Jusas, Vacius ; Motiejūnas, Liudas ; Šeinauskas, Rimantas |
| Full Text |
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| Is Part of |
Informacinės technologijos ir valdymas = Information technology and control.. Kaunas : Technologija. 2010, t. 39, Nr. 2, p. 100-107.. ISSN 1392-124X. eISSN 2335-884X |
| Keywords [eng] |
Meta-programming ; Model-driven development ; Meta-program ; Meta-model |
| Abstract [eng] |
We propose a general framework for the model-driven analysis of the meta-program development processes. Our approach considers: 1) a hierarchy of related meta-models and models that are represented at different levels of abstractions for problem and solution domains; and 2) vertical transformations of the introduced meta-models and models for lowering the abstraction level of their representation until the executable specification. The framework provides a theoretical background to understand the meta-program development process and creates well-grounded pre-conditions for the semi-automatic design of meta-programs. We also formulate the requirements for tools to support such automation. |
| Published |
Kaunas : Technologija |
| Type |
Journal article |
| Language |
English |
| Publication date |
2010 |
| CC license |
|
