Title Properties of variable N-detection functional delay fault tests
Another Title Funkcinių vėlinimo testų su kintamu gedimų aptikimų skaičiumi savybės.
Authors Bareiša, Eduardas ; Jusas, Vacius ; Motiejūnas, Kęstutis ; Šeinauskas, Rimantas
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Is Part of Informacinės technologijos ir valdymas = Information technology and control.. Kaunas : Technologija. 2008, t. 37, Nr. 2, p. 95-100.. ISSN 1392-124X. eISSN 2335-884X
Abstract [eng] The analysis how the functional fault tests detect structural faults at gate-level shows that the stuck-at fault coverage is much higher than transition fault coverage. The aim of the paper is to discover the reasons of this phenomenon and to propose the techniques of functional delay test quality improvement. We suggest, by transformation of pin pair test into functional delay test, to use variable number of fault detections. The performed experiments show the effectiveness of the introduced approach.
Published Kaunas : Technologija
Type Journal article
Language English
Publication date 2008
CC license CC license description