Title Functional test transformation to improve compaction /
Another Title Funkcinių testų transformavimas jų ilgiui sumažinti.
Authors Bareiša, E ; Jusas, V ; Motiejūnas, K ; Šeinauskas, R
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Is Part of Elektronika ir elektrotechnika.. Kaunas : Technologija. 2008, Nr. 3, p. 53-58.. ISSN 1392-1215. eISSN 2029-5731
Abstract [eng] Compact test sets are very important for reducing the cost of testing the very large scale integrated circuits by reducing the test application time. In this work we presented a new procedure of functional static-based test transformation into functional delay test that allows improving test compaction. Experimental results for ISCAS’85 and ITC’99 benchmark circuits showed that the proposed approach reduced test size up to 4.83 times comparing with results presented in other publications whereas average test size reduction was up to 2.87 times.
Published Kaunas : Technologija
Type Journal article
Language English
Publication date 2008
CC license CC license description