| Title |
Testability analysis of the VHDL structure for fault coverage improving / |
| Another Title |
VHDL struktūrų testuojamumo analizė pagerinti klaidų aptinkamumą. |
| Authors |
Hahanov, V.I ; Kaminska, M.A ; Lavrova, O |
| Full Text |
|
| Is Part of |
Elektronika ir elektrotechnika.. Kaunas : Technologija. 2007, Nr. 2, p. 29-32.. ISSN 1392-1215. eISSN 2029-5731 |
| Keywords [eng] |
digital media ; VHDL (computer hardware description language) ; digital electronics |
| Abstract [eng] |
Method of digital device testability analysis, which is represented on the system level (VHDL description) for verification and test synthesis tasks simplification for fault coverage improvement on the given test patterns is offered. Method is based on the topological analysis of circuit, which is represented as RTL blocks and circuit’s further modification by separation of testing and functional procedures for testability improving and testing procedure simplification. |
| Published |
Kaunas : Technologija |
| Type |
Journal article |
| Language |
English |
| Publication date |
2007 |
| CC license |
|
