| Title |
Funkcinių testinių rinkinių vėlinimo gedimams atrinkimo programinės įrangos sudarymas ir tyrimas / |
| Translation of Title |
Research and development of software for functional delay test pattern generation. |
| Authors |
Bieliauskas, Petras |
| Full Text |
|
| Pages |
64 |
| Keywords [eng] |
functional tests ; transition delay fault ; test pattern generation |
| Abstract [eng] |
The increasing complexity of integrated circuits and operating frequency led delay fault identification to become an important part of the schemes development. Software prototypes allow to start testing phase at an early stage. This work covers the delay fault detection method analysis and comparison. For the study is selected transition fault identification. The paper describes the AntiRandom method and customization possibilities for the functional test generation. There is also a brief overview of an existing solutions on the market. The design section describes the designed and implemented system which consists of two subsystems: functional tests generator and results storage and analysis subsystem. Functional test generator has two random methods and customized AntiRandom method. The last part of the document covers an experimental study for the created system. It consists of results of the experiments and conclusions of the whole work. |
| Type |
Master thesis |
| Language |
Lithuanian |
| Publication date |
2010 |
