| Title |
Self-test of air coupled probe for sensitivity map production using parabolic reflector / |
| Authors |
Svilainis, Linas ; Dias, Jorge Camacho Sosa ; Kybartas, Darius ; Chaziachmetovas, Andrius ; Eidukynas, Valdas |
| DOI |
10.1109/TUFFC.2024.3428326 |
| Full Text |
|
| Is Part of |
IEEE transactions on ultrasonics, ferroelectrics, and frequency control.. Piscataway, NJ : IEEE. 2024, vol. 71, iss. 9, p. 1132-1140.. ISSN 0885-3010. eISSN 1525-8955 |
| Keywords [eng] |
air coupled ultrasound ; aperture mask ; beam profile ; finite element analysis ; focused imaging ; focusing ; microphones ; mirrors ; parabolic on-axis mirror ; probe inspection ; probes ; sensitivity ; sensitivity map ; spread spectrum signals ; transducer defects ; transducers |
| Abstract [eng] |
Spatial distribution of a transduction efficiency over the air-coupled probe surface was proposed as a convenient tool for the probe integrity inspection. In this research, a parabolic reflector is used for passive focusing of the acoustic wave on the surface of inspected probe. Therefore, no additional transducer is required for inspection: probe is used for self-inspection. This approach allows to avoid the expensive focused transducer and replaces it by same type air coupled transducers as probe under test. Moreover, use of the parabolic mirror for focusing is frequency-independent, therefore such approach allows to inspect a wide range of the probes. Spread spectrum signals were used for excitation to improve the SNR and bandwidth coverage. Results of the experimental measurements of air-coupled transducer sensitivity map with natural and artificial defects implemented have been presented. Comparison with previously proposed techniques is given. It was found that defects presence distorts the focused beam, creating large sidelobes. Therefore sensitivity map obtained with proposed technique is lower quality than with previously proposed techniques. Beam profile measurements using a miniature microphone have been presented. Aperture-limiting mask has been proposed to reduce the sidelobes arising due to defects presence and resulting measurements quality has been improved. |
| Published |
Piscataway, NJ : IEEE |
| Type |
Journal article |
| Language |
English |
| Publication date |
2024 |
| CC license |
|
