| Title |
Reciprocal space x-ray computed tomography / |
| Authors |
Vailionis, Arturas ; Wu, Liyan ; Spanier, Jonathan E |
| DOI |
10.1063/5.0203995 |
| Full Text |
|
| Is Part of |
APL Materials.. Melville, NY : AIP publishing. 2024, vol. 12, iss. 5, art. no. 051128, p. 1-7.. ISSN 2166-532X |
| Abstract [eng] |
Three-dimensional reciprocal space mapping (3D-RSM) offers crucial insights into the intricate microstructural properties of materials, including spatial domain distribution, directional long-range ordering, multilayer-substrate mismatch, layer tilting, and defect structure. Traditionally, 3D-RSMs are conducted at synchrotron facilities where instrumental resolution is constrained in all three directions. Lab-based sources have often been considered suboptimal for 3D-RSM measurements due to poor instrumental resolution along the axial direction. However, we demonstrate that, by employing three-dimensional reciprocal space x-ray computed tomography (RS-XCT), the same perceived limitation in resolution can be effectively leveraged to acquire high quality 3D-RSMs. Through a combination of ultrafast reciprocal space mapping and computed tomography reconstruction routines, lab-based 3D-RSMs achieve resolutions comparable to those obtained with synchrotron-based techniques. RS-XCT introduces a practical modality for lab-based x-ray diffractometers, enabling high-resolution 3D-RSM measurements on a variety of materials exhibiting complex three-dimensional scattering landscapes in reciprocal space. |
| Published |
Melville, NY : AIP publishing |
| Type |
Journal article |
| Language |
English |
| Publication date |
2024 |
| CC license |
|
