| Title |
The use of Haar wavelets in detecting and localizing texture defects / |
| Authors |
Vaidelienė, Gintarė ; Valantinas, Jonas |
| DOI |
10.5566/ias.1561 |
| Full Text |
|
| Is Part of |
Image Analysis & Stereology.. Ljubljana : International Society for Stereology. 2016, vol. 35, iss. 3, p. 195-201.. ISSN 1580-3139. eISSN 1854-5165 |
| Keywords [eng] |
automatic visual inspection ; defect detection ; discrete wavelets transforms ; statistical data analysis ; texture images |
| Abstract [eng] |
In this paper, a new Haar wavelet-based approach to the detection and localization of defects in grey-level texture images is presented. This new approach explores space localization properties of the discrete Haar wavelet transform (HT) and generates statistically-based parameterized texture defect detection criteria. The criteria provide the user with a possibility to control the percentage of both the actually defect-free images detected as defective and/or the actually defective images detected as defect-free, in the class of texture images under investigation. The experiment analyses samples of ceramic tiles, glass samples, as well as fabric scraps, taken from real factory environment. |
| Published |
Ljubljana : International Society for Stereology |
| Type |
Journal article |
| Language |
English |
| Publication date |
2016 |
| CC license |
|
