Title |
Comparison of different NDT techniques for evaluation of the quality of PCBs produced using traditional vs. additive manufacturing technologies / |
Authors |
Jasiūnienė, Elena ; Raišutis, Renaldas ; Samaitis, Vykintas ; Jankauskas, Audrius |
DOI |
10.3390/s24061719 |
Full Text |
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Is Part of |
Sensors.. Basel : MDPI. 2024, vol. 24, iss. 6, art. no. 1719, p. 1-16.. ISSN 1424-8220 |
Keywords [eng] |
PCB ; quality ; nondestructive testing ; additive manufacturing ; ultrasonic ; radiography ; acoustic microscopy ; thermography |
Abstract [eng] |
Multilayer printed circuit boards (PCBs) can be produced not only in the traditional way but also additively. Both traditional and additive manufacturing can lead to invisible defects in the internal structure of the electronic component, eventually leading to the spontaneous failure of the device. No matter what kind of technology is used for the production of PCBs, when they are used in important structures, quality control is important to ensure the reliability of the component. The nondestructive testing (NDT) of the structure of manufactured electronic components can help ensure the quality of devices. Investigations of possible changes in the structure of the product can help identify the causes of defects. Different types of manufacturing technologies can lead to diverse types of possible defects. Therefore, employing several nondestructive inspection techniques could be preferable for the inspection of electronic components. In this article, we present a comparison of various NDT techniques for the evaluation of the quality of PCBs produced using traditional and additive manufacturing technologies. The methodology for investigating the internal structure of PCBs is based on several of the most reliable and widely used technologies, namely, acoustic microscopy, active thermography, and radiography. All of the technologies investigated have their advantages and disadvantages, so if high-reliability products are to be produced, it would be advantageous to carry out tests using multiple technologies in order to detect the various types of defects and determine their parameters. |
Published |
Basel : MDPI |
Type |
Journal article |
Language |
English |
Publication date |
2024 |
CC license |
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