| Title |
Funkcinių testų metodų vėlinimo gedimams tikrinti sudarymas ir tyrimas / |
| Translation of Title |
Creation and investigation of functional delay test. |
| Authors |
Šimkevičius, Martynas |
| Full Text |
|
| Pages |
77 |
| Keywords [eng] |
functional tests ; delay ; system failures |
| Abstract [eng] |
This work studies the test generation in functional level of the circuits. Such an approach allows developing the test at the early stages of the design process in parallel with other activities of this process. Created test generation algorithm of the functional test that is based solely on the primary input values and the primary output values of the programming prototype. The experiment contains 35 logic schemas processed test generation algorithm on 15 different powers CPU. The results of experiment shows that suggested algorithm is capable to find all needed pairs to complete functional test and the speed of algorithm is measurable at the same time. |
| Type |
Master thesis |
| Language |
Lithuanian |
| Publication date |
2007 |
