| Abstract [eng] |
Automated test pattern generation (ATPG) problem is being solved for a relatively long time. Its' point is to find optimal test vector sequences, which would cover most of all production-caused digital circuit faults and would run for the minimum amount of time. One of the ways to test and generate test vectors for digital circuits is functional test method. Its' benefit is that system does not need to be aware of digital circuit's inner logical model, but has to deal only with the input, so that just the ideal model of the digital circuit can be used as a \"black box\". The program's algorithm can get ideal digital circuit's reaction for corresponding input test vector. This paper will mostly cover functional model approach to ATPG. This paper covers automated test vector generation software basic theory with brief historical review, comparison of white box and black box models' testing and test vector generation algorithms. Also the software's static structures along with its components, system’s typical use cases are covered. The research part of the paper is focused mostly on the algorithms used, containing research methods which provide the results for the experiment part. |
