| Abstract [eng] |
Nowadays new technologies contains the bigger part of our lifes, we couldnt imagine our selves without them. Otherwise, not all creations of new technologies are serving so long, also not all of them are serving right and effectively. When the system size degrees, the metal grows, and the time working on chips grows – the delay fault testing becomes very important part of system creation process. The delay fault test answers to the question does the system works right and without any big loses. The test process has important point in Delay test has been investigated for many years. We can say that test process contains on these steps: setting the purpose of the test, designing the test, controlling the test process, perform the test and analyze test results. Also we will shortly discuss about basic gauge of testing process. The main point of this paper is to analyze the models of delay faults test processes. To see the best and the worst sides of delay faults and represent experimental test to demonstrate the the robust and non-robust test advantagies in delay fault test. |
