Title A-site acceptor doped LaNbO4 thin film formation and structural investigation /
Authors Bockute, Kristina ; Virbukas, Darius ; Laukaitis, Giedrius
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Is Part of Journal of Measurements in Engineering.. Kaunas : JVE International. 2015, vol. 3, iss. 4, art. no. 76, p. 105.. ISSN 2335-2124
Keywords [eng] electron beam evaporation ; nanocrystalline ; proton conducting fuel cells (PCFC) ; doped lanthanum niobium oxide, LaNbO4
Abstract [eng] In this paper, doped La1-xAxNbO4 (A = Ca, Mg) thin films were formed using electron beam vapor deposition. The influence of the doping concentration of A site dopants (A = Ca, Mg) on the thin ceramics surface microstructure, morphology and electrical properties, including the charge carrier mobility and diffusion coefficient, was studied. It was found that the formed thin films are dense (>96 %) and have homogenous nanocrystalline structure composed of the tetragonal LaNbO4 phase. The total conductivity of the formed thin films is in 10-3 S/cm range for Ca-doped LaNbO4 and 10-4 S/cm range for Mg-doped LaNbO4 at 800 °C under wet H2 reducing atmosphere. The nature of protonic conduction was confirmed by the isotopic effect. The calculated is 57 kJ/mol at 650 °C for the La0.995Ca0.005NbO4 film, which total conductivity was highest in the present study (9.52∙10-3 S/cm at 800 °C under wet H2 reducing atmosphere). increases steadily with increasing the dopants’ concentration from 57 kJ/mol to 84 kJ/mol. The charge mobility decreases from 2.32×10-5 cm2/V∙s to 6.25×10-7 cm2/V∙s as the dopants’ concentration increases at 650 °C.
Published Kaunas : JVE International
Type Journal article
Language English
Publication date 2015
CC license CC license description