| Abstract [eng] |
The purpose of work was to investigate the alumina dopants effect on the microstructure, crystallinity, and ionic conductivity of scandium stabilized zirconium oxide thin films that were formed by using e-beam deposition technique. Research problem The absence of a detailed analysis of physical and technological properties, the effect of the ratio of components, morphology of particles, phase composition, parameters of the crystal structure of phases in thin films of the ZrO2–Sc2O3–Al2O3 systems. Research aim and objectives The research aim is to systematically and comprehensively investigate the influence of alumina dopants on the microstructure, crystallinity, and ionic conductivity of scandia stabilized zirconium oxide thin films. The research objectives is to form thin ceramic films of ZrO2–Sc2O3–Al2O3 systems using e-beam physical vapor deposition technique by changing the technological parameters and study the crystal phase composition of the formed thin films using Raman spectroscopy and X-ray diffraction analysis. Also, study the ionic conductivity of the formed thin films. Scientific novelty The information on three-component ZrO2 -Sc2O3- MxOy oxide systems is extremely small. The possible effect of the co-dopants on the structure and conductivity of grain boundaries should be noted separately, which is clearly manifested in the case of the Al2O3 - ScSZ system. It is very important to cover a range of novel description of phase content and ionic conductivity properties of ZrO2–Sc2O3–Al2O3 systems, because co-doping of a third component to ScSZ system can lead to a change in the structure and hence the mechanical properties and stability, as well as a change in the number and mobility of oxygen vacancies. The volume of the dissertation is 156 pages, including 60 figures, 30 tables, 22 numbered equations, and 203 references. |
